DocumentCode :
1815862
Title :
Multi-resolution Abnormal Trace Detection Using Varied-length N-grams and Automata
Author :
Jiang, Guofei ; Chen, Haifeng ; Ungureanu, Cristian ; Yoshihira, Kenji
Author_Institution :
NEC Labs., Princeton, NJ
fYear :
2005
fDate :
13-16 June 2005
Firstpage :
111
Lastpage :
122
Abstract :
Detection and diagnosis of faults in a large-scale distributed system is a formidable task. Interest in monitoring and using traces of user requests for fault detection has been on the rise recently. In this paper we propose novel fault detection methods based on abnormal trace detection. One essential problem is how to represent the large amount of training trace data compactly as an oracle. Our key contribution is the novel use of varied-length n-grams and automata to characterize normal traces. A new trace is compared against the learned automata to determine whether it is abnormal. We develop algorithms to automatically extract n-grams and construct multiresolution automata from training data. Further both deterministic and multihypothesis algorithms are proposed for detection. We inspect the trace constraints of real application software and verify the existence of long n-grams. Our approach is tested in a real system with injected faults and achieves good results in experiments
Keywords :
automata theory; deterministic algorithms; fault diagnosis; large-scale systems; learning (artificial intelligence); program diagnostics; software fault tolerance; deterministic algorithm; fault detection; fault diagnosis; fault injection; large-scale distributed system; learned automata; multihypothesis algorithm; multiresolution abnormal trace detection; trace constraints; user requests; varied-length n-grams; Application software; Data mining; Fault detection; Fault diagnosis; Large-scale systems; Learning automata; Monitoring; Multiresolution analysis; System testing; Training data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autonomic Computing, 2005. ICAC 2005. Proceedings. Second International Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7965-2276-9
Type :
conf
DOI :
10.1109/ICAC.2005.42
Filename :
1498057
Link To Document :
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