DocumentCode
1816011
Title
InAs quantum dot evolution observed by in-situ scanning tunneling microscopy during molecular beam epitaxy growth
Author
Tsukamoto, Shiro
Author_Institution
Anan Nat. Coll. of Technol., Anan
fYear
2008
fDate
25-29 May 2008
Firstpage
1
Lastpage
4
Abstract
We have successfully investigated the self-assembly mechanism for InAs quantum dots (QDs) formed on GaAs(001) by using a unique scanning tunnelling microscope (STM) placed within the molecular beam epitaxy (MBE) growth chamber. The images elucidate the mechanism of QD nucleation, demonstrating directly that not all deposited In is initially incorporated into the lattice, hence providing a large supply of material to rapidly form QDs via islands containing tens of atoms. kinetic Monte Carlo (kMC) simulations based on first-principles calculations show that tiny alloy fluctuations, like atomistic point defects, in the InGaAs wetting layer prior to are crucial in determining nucleation sites.
Keywords
III-V semiconductors; Monte Carlo methods; ab initio calculations; indium compounds; molecular beam epitaxial growth; nucleation; point defects; scanning tunnelling microscopy; self-assembly; semiconductor growth; semiconductor quantum dots; GaAs; InAs; atomistic point defects; first-principles calculations; in-situ scanning tunneling microscopy; kinetic Monte Carlo simulations; molecular beam epitaxy; nucleation; quantum dots; self-assembly; wetting layer; Atomic layer deposition; Fluctuations; Kinetic theory; Lattices; Microscopy; Molecular beam epitaxial growth; Monte Carlo methods; Quantum dots; Self-assembly; Tunneling; GaAs; InAs; Quantum Dots; in-situ; molecular beam epixtaxy; scanning tunnelling microscope;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 2008. IPRM 2008. 20th International Conference on
Conference_Location
Versailles
ISSN
1092-8669
Print_ISBN
978-1-4244-2258-6
Electronic_ISBN
1092-8669
Type
conf
DOI
10.1109/ICIPRM.2008.4703061
Filename
4703061
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