Title :
Wavelength shift analysis of TE and TM polarized fields in planar lightwave circuits
Author :
Song, Won Jay ; Ahn, Byung Ha
Author_Institution :
Syst. Eng. & Oper. Res. Labs., KwangJu Inst. of Sci. & Technol., South Korea
Abstract :
We have applied the effective index method to reduce the two-dimensional refractive index profile into the one-dimensional refractive index structure and modified the wave equations to obtain the paraxial wave equations. Then, TE and TM polarized fields in the curved single-mode planar waveguides are analyzed by using the scalar beam-propagation method employing the finite-difference method with a slab structure. The birefringence for TE and TM polarized fields in bent waveguides is calculated from the phase difference of the optical fields. The wavelength shift due to the birefringence of TE and TM polarized fields in bent waveguides is also calculated
Keywords :
birefringence; finite difference methods; light polarisation; optical planar waveguides; optical waveguide theory; optical wavelength conversion; refractive index; wave equations; waveguide discontinuities; PLCs; TE polarized fields; TM polarized fields; bent waveguides; birefringence; curved single-mode planar waveguides; effective index method; finite-difference method; one-dimensional refractive index structure; optical fields; paraxial wave equation; phase difference; planar lightwave circuits; scalar beam-propagation method; slab structure; two-dimensional refractive index profile; wave equations; wavelength shift analysis; Birefringence; Finite difference methods; Optical planar waveguides; Optical polarization; Optical waveguides; Partial differential equations; Planar waveguides; Refractive index; Slabs; Tellurium;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Conference_Location :
Phoenix-Scottsdale, AZ
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010935