DocumentCode
1816147
Title
Bacterial attachment response to nanostructured titanium surfaces
Author
Truong, Vi Khanh ; Wang, James Y. ; Shurui, Wang ; Malherbe, Francois ; Berndt, Christopher C. ; Crawford, Russell J. ; Ivanova, Elena P.
Author_Institution
Fac. Life & Social Sci., Swinburne Univ. of Technol., Hawthorn, VIC, Australia
fYear
2010
fDate
22-26 Feb. 2010
Firstpage
253
Lastpage
256
Abstract
The effect of sub-nanometric surface roughness of Ti thin films surfaces on the attachment of two human pathogenic bacteria, Staphylococcus aureus CIP 65.8T and Pseudomonas aeruginosa ATCC 9027, was studied. A magnetron sputtering thin film deposition system was used to control the titanium thin film thicknesses of 3 nm, 12 nm and 150 nm on silicon wafers with corresponding surface roughness parameters of Rq 0.14 nm, 0.38 nm and 5.55 nm (1 μm × 1 μm scanning area). Analysis of bacterial retention profiles showed that the bacteria responded differently changes in the Ra and Rq (Ti thin film) surface roughness parameters of a less than 1 nm, with up to 2-3 times: more cells being retained on the surface, and elevated levels of extracellular polymeric substances being secreted on the Ti thin films, in particular on the surfaces with 0.14 nm (Rq) roughness.
Keywords
metallic thin films; microorganisms; nanofabrication; nanostructured materials; sputter deposition; surface roughness; titanium; Pseudomonas aeruginosa ATCC 9027; Si; Staphylococcus aureus CIP 65.8T; Ti; Ti thin films surfaces; bacterial attachment response; bacterial retention profiles; cells; extracellular polymeric substances; human pathogenic bacteria; magnetron sputtering thin film deposition; nanostructured titanium surfaces; silicon wafers; size 12 nm; size 150 nm; size 3 nm; subnanometric surface roughness; Microorganisms; Rough surfaces; Surface morphology; Surface roughness; Surface topography; Surface treatment; Titanium; bacterial attachment; sub-nanometric surface morphology; titanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoscience and Nanotechnology (ICONN), 2010 International Conference on
Conference_Location
Sydney, NSW
Print_ISBN
978-1-4244-5261-3
Electronic_ISBN
978-1-4244-5262-0
Type
conf
DOI
10.1109/ICONN.2010.6045205
Filename
6045205
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