Title :
Heat transfer predictions of the Poisson noise model for nonlinear devices
Author_Institution :
Analog Devices Inc., Wilmington, MA, USA
Abstract :
Previous work has shown that a Poisson model for noise in nonlinear devices satisfied several thermodynamic tests when,connected to fairly general circuits containing lossless elements and possibly Nyquist-Johnson noisy resistors. This paper adds yet another test: does the model predict heat transfer between nonlinear devices, or between a nonlinear device and a linear resistor? In short, to extend the classic Brillouin Paradox, can a diode rectify another diode´s thermal noise?
Keywords :
Gaussian noise; Markov processes; circuit noise; heat transfer; nonlinear network analysis; resistors; semiconductor device models; semiconductor device noise; semiconductor diodes; Gaussian noise model; Nyquist-Johnson noisy resistors; Poisson noise model; classic Brillouin paradox; continuous-time Markov process; diode rectification; diode thermal noise; heat transfer predictions; linear resistor; lossless elements; nonlinear devices; thermodynamic tests; Capacitors; Circuit noise; Circuit testing; Diodes; Heat transfer; Markov processes; Predictive models; Resistors; Steady-state; Thermodynamics;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Conference_Location :
Phoenix-Scottsdale, AZ
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010941
