Title :
Device and material characterization at mm-wave and terahertz
Author :
De Chirico, Giancarlo
Author_Institution :
Applic. Eng., Agilent Technol. Agilent Technol., Rome, Italy
Abstract :
In this paper I will overview the classes of methods employed to measure the dielectric properties of solids and liquids and will discuss the criteria one should consider when selecting a measurement technique. The focus will be on those techniques useful for measuring the relative permittivity and loss tangent of dielectric materials, both liquid and solid, over a frequency range that covers 100 MHz to 1.1Thz.
Keywords :
dielectric materials; dielectric properties; permittivity measurement; device characterization; dielectric materials; dielectric properties; frequency 100 MHz to 1.1 THz; material characterization; measurement technique; relative permittivity; Dielectrics; Materials; Measurement techniques; Permittivity measurement; Software measurement; Transmission line measurements; MUT; dielectric; liquid; material; mm-wave; solid; terahertz; test;
Conference_Titel :
Millimeter Waves and THz Technology Workshop (UCMMT), 2013 6th UK, Europe, China
Conference_Location :
Rome, Italy
DOI :
10.1109/UCMMT.2013.6641517
