Title :
Low-frequency symbolic analysis of large analog integrated circuits
Author :
Hsu, Jer-Jaw ; Sechen, Carl
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
A low-frequency symbolic analysis tool (Sifter) which can handle large linearized analog circuits is presented. The tool outputs simplified symbolic expressions for any desired low-frequency transfer function, including input resistances, output resistances, and current and voltage gains. It also provides simplified symbolic expressions for noise analysis, sensitivity analysis, and power supply rejection ratio. The numerical accuracy of a simplified symbolic expression is automatically adjusted so that the size of the expression is sufficiently compact to give the user insight into the behavior of the circuit. The simplified result is expressed as a ratio of two products of sums. The tool can easily handle analog circuits containing 90 device parameters. Very compact symbolic expressions for the low-frequency voltage gains of the 741 and 725 operational amplifiers were obtained in less than 40 CPU (central processing unit) seconds on a SUN SPARCstation 2, and the simplified results were numerically within 12% of the exact values
Keywords :
analogue integrated circuits; Sifter; current gain; input resistances; large analog integrated circuits; low-frequency symbolic analysis tool; low-frequency transfer function; noise analysis; operational amplifiers; output resistances; power supply rejection ratio; sensitivity analysis; simplified symbolic expressions; voltage gains; Analog circuits; Analog integrated circuits; Central Processing Unit; Integrated circuit noise; Low-frequency noise; Power supplies; Sensitivity analysis; Signal to noise ratio; Transfer functions; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0826-3
DOI :
10.1109/CICC.1993.590716
