Title :
A histogram method for analog-digital converters testing in time and spectral domain
Author :
Zagursky, V. ; Semyonova, N. ; Sirovatkina, M.
Author_Institution :
Inst. of Electron. & Comput. Sci., Acad. of Sci., Riga, Latvia
Abstract :
A method is oriented toward the acquisition of the ADC input-output function as the systems objects with dynamic nonlinear and stochastic properties. It is possible to utilize input-output function to estimate the dynamic error of ADC in spectral domain, without the use of additional hardware or measurements
Keywords :
analogue-digital conversion; circuit testing; statistical analysis; ADC input-output function; ADC testing; analog-digital converters; dynamic error; histogram method; spectral domain; Analog-digital conversion; Computer science; Frequency estimation; Hardware; Histograms; Nonlinear dynamical systems; Nonlinear systems; Quantization; Signal processing; System testing;
Conference_Titel :
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-7039-8
DOI :
10.1109/EDTC.1995.470322
