• DocumentCode
    1816780
  • Title

    Development and demonstration of silicon carbide (SiC) motor drive inverter modules

  • Author

    Chang, H.-R. ; Hanna, E. ; Radun, A.V.

  • Author_Institution
    Rockwell Sci. Co., Thousand Oaks, CA, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    15-19 June 2003
  • Firstpage
    211
  • Abstract
    This paper describes a new SiC-based motor drive technology used to achieve compact power conversion. The static and dynamic characterization of 600 V SiC MOS-enhanced JFETs and SiC Schottky free-wheeling diodes (FWDs) designed and fabricated at Rockwell Scientific, are performed. Single 5 A SiC JFET and Schottky FWD die with a voltage rating of 600 V are paralleled to obtain 10 A, and 25 A, current ratings. The power loss and related voltage and current stress of the SiC MOS-enhanced JFET and SiC Schottky FWD are measured and compared to that of a state-of-the-art silicon IGBTs and PIN FWDs with ratings equal to the SiC ratings. For the same power rating (25 A, 600 V), the area of the SiC die making up the inverter module are about 60% of a commercial 25 A IGBT die. The Rockwell Automation RA Model 1336 motor controller is used, with its gate drive circuit modified to control the SiC depletion-mode MOS-enhanced JFETs, to control a motor. SiC inverter modules are fabricated and used to successfully drive 1 hp to 10 hp motors. To our knowledge, this is the first time that a motor drive using SiC inverter modules has been demonstrated.
  • Keywords
    AC motor drives; Schottky diodes; circuit layout CAD; invertors; junction gate field effect transistors; losses; machine control; 1 to 10 hp; 10 A; 25 A; 5 A; 600 V; MOS-enhanced JFET; Rockwell Automation RA Model 1336 motor controller; Rockwell Scientific; Schottky FWD die; SiC; SiC MOS-enhanced JFET; SiC Schottky FWD; SiC Schottky free-wheeling diodes; SiC depletion-mode MOS-enhanced JFET; compact power conversion; current stress; dynamic characterization; gate drive circuit; inverter module; motor drive inverter modules; power loss; power rating; silicon carbide; state-of-the-art silicon IGBT; static characterization; voltage stress; Automatic control; Insulated gate bipolar transistors; Inverters; JFETs; Motor drives; Power conversion; Schottky diodes; Silicon carbide; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialist Conference, 2003. PESC '03. 2003 IEEE 34th Annual
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-7754-0
  • Type

    conf

  • DOI
    10.1109/PESC.2003.1218297
  • Filename
    1218297