DocumentCode
1816780
Title
Development and demonstration of silicon carbide (SiC) motor drive inverter modules
Author
Chang, H.-R. ; Hanna, E. ; Radun, A.V.
Author_Institution
Rockwell Sci. Co., Thousand Oaks, CA, USA
Volume
1
fYear
2003
fDate
15-19 June 2003
Firstpage
211
Abstract
This paper describes a new SiC-based motor drive technology used to achieve compact power conversion. The static and dynamic characterization of 600 V SiC MOS-enhanced JFETs and SiC Schottky free-wheeling diodes (FWDs) designed and fabricated at Rockwell Scientific, are performed. Single 5 A SiC JFET and Schottky FWD die with a voltage rating of 600 V are paralleled to obtain 10 A, and 25 A, current ratings. The power loss and related voltage and current stress of the SiC MOS-enhanced JFET and SiC Schottky FWD are measured and compared to that of a state-of-the-art silicon IGBTs and PIN FWDs with ratings equal to the SiC ratings. For the same power rating (25 A, 600 V), the area of the SiC die making up the inverter module are about 60% of a commercial 25 A IGBT die. The Rockwell Automation RA Model 1336 motor controller is used, with its gate drive circuit modified to control the SiC depletion-mode MOS-enhanced JFETs, to control a motor. SiC inverter modules are fabricated and used to successfully drive 1 hp to 10 hp motors. To our knowledge, this is the first time that a motor drive using SiC inverter modules has been demonstrated.
Keywords
AC motor drives; Schottky diodes; circuit layout CAD; invertors; junction gate field effect transistors; losses; machine control; 1 to 10 hp; 10 A; 25 A; 5 A; 600 V; MOS-enhanced JFET; Rockwell Automation RA Model 1336 motor controller; Rockwell Scientific; Schottky FWD die; SiC; SiC MOS-enhanced JFET; SiC Schottky FWD; SiC Schottky free-wheeling diodes; SiC depletion-mode MOS-enhanced JFET; compact power conversion; current stress; dynamic characterization; gate drive circuit; inverter module; motor drive inverter modules; power loss; power rating; silicon carbide; state-of-the-art silicon IGBT; static characterization; voltage stress; Automatic control; Insulated gate bipolar transistors; Inverters; JFETs; Motor drives; Power conversion; Schottky diodes; Silicon carbide; Stress; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialist Conference, 2003. PESC '03. 2003 IEEE 34th Annual
ISSN
0275-9306
Print_ISBN
0-7803-7754-0
Type
conf
DOI
10.1109/PESC.2003.1218297
Filename
1218297
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