• DocumentCode
    1817348
  • Title

    A general framework of importance sampling for value-at-risk and conditional value-at-risk

  • Author

    Sun, Lihua ; Hong, L. Jeff

  • Author_Institution
    Dept. of Ind. Eng. & Logistics Manage., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2009
  • fDate
    13-16 Dec. 2009
  • Firstpage
    415
  • Lastpage
    422
  • Abstract
    Value-at-risk (VaR) and conditional value-at-risk (CVaR) are important risk measures. Importance sampling (IS) is often used to estimate them. We derive the asymptotic representations for IS estimators of VaR and CVaR. Based on these representations, we are able to give simple conditions under which the IS estimators have smaller asymptotic variances than the ordinal estimators. We show that the exponential twisting can yield an IS distribution that satisfies the conditions for both the IS estimators of VaR and CVaR. Therefore, we may be able to estimate VaR and CVaR accurately at the same time.
  • Keywords
    importance sampling; risk management; CVaR; asymptotic representation; conditional value-at-risk; importance sampling; Engineering management; Industrial engineering; Logistics; Monte Carlo methods; Portfolios; Reactive power; Risk management; Robustness; Sun; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), Proceedings of the 2009 Winter
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-5770-0
  • Type

    conf

  • DOI
    10.1109/WSC.2009.5429348
  • Filename
    5429348