DocumentCode
1817456
Title
An a contrario approach for outliers segmentation: Application to Multiple Sclerosis in MRI
Author
Rousseau, F. ; Blanc, F. ; de Seze, J. ; Rumbach, L. ; Armspach, J.P.
Author_Institution
UMR CNRS/ULP 7005 61 All Illkirch, Illkirch
fYear
2008
fDate
14-17 May 2008
Firstpage
9
Lastpage
12
Abstract
The detection of Multiple Sclerosis (MS) lesions in Magnetic Resonance (MR) images remains an important issue in medical image processing. Diagnostic criteria for MS based on brain MRI concern mainly dissemination in space and time. In this context, this paper describes a novel region- based approach to automatically count the number of MS lesions present in a set of MR images. Given a set of candidate regions obtained with a mean-shift based segmentation, the detection algorithm decides for each region if it is part of a MS lesion or if it belongs to non-pathologic regions (white matter (WM), grey matter (GM) or cerebro-spinal fluid (CSF)). The distribution of each brain tissue is modeled using a Gaussian Mixture Model and MS lesions are detected as outliers with respect to this model. Finally, we propose several criteria for segmentation assessment and we validate our algorithm on the Brain Web data set. Preliminary results on clinical data are also shown.
Keywords
Gaussian distribution; biological tissues; biology computing; biomedical MRI; brain; cellular biophysics; image segmentation; medical image processing; Brain Web data set; Gaussian mixture model; MRI; brain tissue; cerebro-spinal fluid; contrario approach; detection algorithm; grey matter; mean-shift based segmentation; medical image processing; multiple sclerosis lesions; white matter; Brain modeling; Hidden Markov models; Image analysis; Image edge detection; Image segmentation; Kernel; Lesions; Magnetic resonance imaging; Motion detection; Multiple sclerosis; Brain Segmentation; MRI; Multiple Sclerosis Lesions; a contrario Framework;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-2002-5
Electronic_ISBN
978-1-4244-2003-2
Type
conf
DOI
10.1109/ISBI.2008.4540919
Filename
4540919
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