Second-harmonic phase spectroscopy of porous silicon based photonic crystals combined with microcavities

Summary form only given. Photonic crystals (PC) and microcavities (MC) are in the focus of the basic interest of both fundamental and applied research. In this paper the combined second-harmonic (SH) intensity and phase spectroscopy is proposed as a direct probe of localization of the light inside porous silicon PC and MC. The choice of microstructures based on porous silicon is attributed with their great practical importance since the all-silicon electrochemical technique of the growth of such structures could be easily incorporated in the silicon technology.