Second-harmonic phase spectroscopy of porous silicon based photonic crystals combined with microcavities

Author

Dolgova, T.V. ; Martemyanov, M.G. ; Fedyanin, A.A. ; Aktsipetrov, O.A. ; Schuhmacher, D. ; Marowsky, G. ; Yakovlev, V.A. ; Mattei, G.

Author_Institution

Dept. of Phys., Moscow State Univ., Russia

fYear

2001

fDate

11-11 May 2001

Firstpage

72

Lastpage

73

Abstract

Summary form only given. Photonic crystals (PC) and microcavities (MC) are in the focus of the basic interest of both fundamental and applied research. In this paper the combined second-harmonic (SH) intensity and phase spectroscopy is proposed as a direct probe of localization of the light inside porous silicon PC and MC. The choice of microstructures based on porous silicon is attributed with their great practical importance since the all-silicon electrochemical technique of the growth of such structures could be easily incorporated in the silicon technology.

Keywords

crystal microstructure; micro-optics; optical harmonic generation; photonic band gap; porous semiconductors; silicon; spectroscopy; SHG spectroscopy; Si; centrosymmetric materials; dielectric constant; electrochemical technique; microcavities; phase spectroscopy; photonic crystals; porous silicon; porous silicon based photonic crystals; second-harmonic intensity spectroscopy; second-harmonic phase spectroscopy; Microcavities; Optical films; Optical harmonic generation; Optical reflection; Photonic crystals; Polarization; Probes; Silicon; Spectroscopy; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Quantum Electronics and Laser Science Conference, 2001. QELS '01. Technical Digest. Summaries of Papers Presented at the

Conference_Location

Baltimore, MD, USA

Print_ISBN

1-55752-663-X

Type

conf

DOI

10.1109/QELS.2001.961872

Filename

961872