• DocumentCode
    1817508
  • Title

    Characterisation of an ultra-thin multilayer structure for spintronic materials

  • Author

    Chan, Kevin K F ; Hambe, Michael ; Petersen, Tim ; Ringer, Simon P. ; Cairney, Julie M.

  • Author_Institution
    Australian Key Centre for Microscopy & Microanalysis, Univ. of Sydney, Sydney, NSW, Australia
  • fYear
    2010
  • fDate
    22-26 Feb. 2010
  • Firstpage
    329
  • Lastpage
    332
  • Abstract
    We report on the synthesis of magnetic tunnel junctions using pulsed laser deposition. High resolution transmission electron microscope images of the multi-layer hetero-structures portray continuous thin films, with abrupt and flat interfaces of a few nanometers in thickness. Energy filtered transmission electron microscopy and energy dispersive X-ray spectroscopy line scans were used to assess elemental profiles and confirm the successful synthesis of an ultra-thin tunnel junction.
  • Keywords
    X-ray chemical analysis; bismuth compounds; ferromagnetic materials; lanthanum compounds; magnetic multilayers; magnetic thin films; pulsed laser deposition; strontium compounds; transmission electron microscopy; tunnelling magnetoresistance; La0.67Sr0.33MnO-SrRuO3-BiFeO3; SrTiO3; continuous thin films; elemental profiles; energy dispersive X-ray spectroscopy; energy filtered transmission electron microscopy; ferromagnetic materials; high resolution transmission electron microscopy; magnetic tunnel junctions; magnetoresistance; nanometer thickness; pulsed laser deposition; spintronic materials; ultrathin multilayer structure; Junctions; Magnetic force microscopy; Magnetic tunneling; Materials; Microscopy; magnetic tunnel junctions; pulsed laser depositon; spintronics; transmission electron microscope; tunnel magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoscience and Nanotechnology (ICONN), 2010 International Conference on
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    978-1-4244-5261-3
  • Electronic_ISBN
    978-1-4244-5262-0
  • Type

    conf

  • DOI
    10.1109/ICONN.2010.6045255
  • Filename
    6045255