Title :
Computation of exact random pattern detection probability
Author :
Farhat, Hassan ; Lioy, Antonio ; Poncino, Massimo
Author_Institution :
Math. & Comput. Sci., Nebraska Univ., Omaha, NE, USA
Abstract :
An exact method for computing the fault detection probability of pseudorandom patterns is presented. The method is based on the global difference function of the faults. Proper manipulation of the Boolean function of a circuit can lead to the fast computation of its exact full detectability profile, thus avoiding the computational burden of exhaustive simulation. This method, besides strongly outperforming exhaustive fault simulation, applies to real circuits, such as many of those in the ISCAS´85 and ISCAS´89 benchmark sets
Keywords :
fault diagnosis; ATPG; BIST; Boolean function; DFT; algorithm; binary decision diagrams; exact random pattern detection probability; fast computation; fault detection; global difference function; probability; pseudorandom patterns; real circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Fault detection; Probability; Test pattern generators; Upper bound;
Conference_Titel :
Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0826-3
DOI :
10.1109/CICC.1993.590784
