DocumentCode :
1817665
Title :
Efficient estimation of SEU effects in SRAM-based FPGAs
Author :
Reorda, M. Sonza ; Sterpone, L. ; Violante, M.
Author_Institution :
Dip. di Automatica e Informatica, Politecnico di Torino, Italy
fYear :
2005
fDate :
6-8 July 2005
Firstpage :
54
Lastpage :
59
Abstract :
SRAM-based FPGAs are becoming very appealing for several applications where high dependability is a mandatory requirement. Unfortunately, the technology of SRAM-based FPGAs is very sensitive to single event upsets (SEUs) and particular concerns arise from SEUs affecting the FPGAs´ configuration memory. In this paper we propose a new method for assessing the impact of faults in the configuration memory on the FPGA dependability. The method uses static analysis, thus reducing greatly the time for performing dependability evaluation.
Keywords :
SRAM chips; failure analysis; field programmable gate arrays; radiation effects; SEU effects; SRAM-based FPGA; configuration memory; field programmable gate arrays; single event upsets; static analysis; Circuit faults; Costs; Field programmable gate arrays; Ionizing radiation; Mission critical systems; Performance analysis; Performance evaluation; Random access memory; Single event upset; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
Type :
conf
DOI :
10.1109/IOLTS.2005.26
Filename :
1498129
Link To Document :
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