DocumentCode
1817759
Title
Trends and trade-offs in designing highly robust throughput computing oriented chips and systems
Author
Parulkar, Ishwar ; Cypher, Robert
fYear
2005
fDate
6-8 July 2005
Firstpage
74
Lastpage
77
Abstract
Silicon technology trends of 65nm technology and architectural trends of the next generation of processors, chip-sets and systems are driving new design paradigms and shifts in the approaches towards robust system design. This paper addresses the convergence of these trends in designing the next generation of highly reliable systems at Sun Microsystems.
Keywords
combinational circuits; digital systems; flip-flops; integrated circuit design; integrated circuit reliability; logic design; microprocessor chips; Sun Microsystems; combinational circuits; computing oriented chips; digital systems; flip-flops; integrated circuit design; integrated circuit reliability; logic design; microprocessor chips; silicon technology; Availability; Error correction codes; Logic; Microprocessors; Protection; Random access memory; Robustness; Silicon; Sun; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN
0-7695-2406-0
Type
conf
DOI
10.1109/IOLTS.2005.68
Filename
1498133
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