Title :
Use of nuclear codes for neutron-induced nuclear reactions in microelectronics
Author :
Wrobel, Frédéric
Author_Institution :
Univ. de Nice-Sophia Antipolis, France
Abstract :
Neutron induced nuclear reactions are known to be responsible for triggering various failures in microelectronics. Nuclear codes are very useful tools, which allow estimating the production of the secondary ions and finally the way that the component is ionized. In this work we propose to give an overview of the kind of available nuclear codes. We distinguish determinist codes from Monte Carlo ones and explained why these latter are the best adapted for the study of neutron induced failures in microcircuits.
Keywords :
Monte Carlo methods; failure analysis; integrated circuit reliability; integrated circuit testing; neutron effects; Monte Carlo codes; failure analysis; integrated circuit reliability; integrated circuit testing; microcircuit failure; microelectronics; neutron effects; neutron-induced nuclear reactions; nuclear codes; Atmosphere; Charge carrier processes; Microelectronics; Monte Carlo methods; Neutrons; Nuclear power generation; Production; Radiation effects; Silicon; Single event upset;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.69
