Title :
On-line error detection and BIST for the AES encryption algorithm with different S-box implementations
Author :
Ocheretnij, V. ; Kouznetsov, G. ; Gössel, M. ; Karri, R.
Author_Institution :
Potsdam Univ., Germany
Abstract :
In this paper we experimentally investigate the efficiency of concurrent checking for the AES encryption algorithm (Rijndael) by parity modification according to K. Wu et al. (2004). Also we propose a simple BIST method. For BIST the implementation of the AES algorithm itself is used as well as a pseudo-random test input generator and a compactor of the test results. Thereby we utilized the property of the AES algorithm that arbitrarily given plain texts are encrypted by the successive rounds into "pseudo-random" cipher texts which are the (test) inputs for the next round. The complete data path of the AES algorithm is simulated as a netlist of AND-, NAND-, OR-, NOR- and XOR-gates. All possible single stuck-at faults are injected and simulated. For a special implementation of the S-boxes all errors within the data path of the AES algorithm due to single stuck-at faults are immediately detected.
Keywords :
automatic test pattern generation; built-in self test; cryptography; error detection; logic testing; random number generation; AES encryption algorithm; BIST; S-box implementations; concurrent checking; on-line error detection; parity modification; pseudo-random cipher texts; pseudo-random test input generator; stuck-at faults; Built-in self-test; Circuit faults; Circuit testing; Computer errors; Concrete; Concurrent computing; Cryptography; Electronic mail; Fault detection; Fault tolerance;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.51
