• DocumentCode
    1818170
  • Title

    Bit Reliability-driven Template Matching in Iris Recognition

  • Author

    Rathgeb, Christian ; Uhl, Andreas

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Salzburg, Salzburg, Austria
  • fYear
    2010
  • fDate
    14-17 Nov. 2010
  • Firstpage
    70
  • Lastpage
    75
  • Abstract
    Of all the biometric applications available today, it is generally conceded that iris recognition is one of the most accurate. In the past several years a huge amount of iris recognition algorithms have been proposed. However, the vast majority of proposed algorithms restrict to extracting distinct features out of preprocessed iris textures to generate discriminative binary iris-codes, neglecting potential improvements in matching procedures. In this work we present a new technique for matching binary iris-codes. Information of authentication procedures is leveraged by maintaining so-called reliability masks for each user, which indicate local consistency of enrollment templates. Based on user-specific reliability masks a weighted matching procedure is performed in order to improve recognition performance. We apply the proposed matching procedure to different iris recognition algorithms and compare obtained recognition rates to other matching techniques. Experimental results confirm the worthiness of our approach.
  • Keywords
    authorisation; binary codes; feature extraction; image matching; iris recognition; reliability; authentication procedure; binary iris code; biometric application; bit reliability; enrollment template; iris recognition; recognition performance; reliability mask; template matching; user specific reliability mask; weighted matching procedure; Authentication; Feature extraction; Hamming distance; Iris; Iris recognition; Pixel; Reliability; Biometric Template Matching; Biometrics; Bit Reliability; Iris Recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image and Video Technology (PSIVT), 2010 Fourth Pacific-Rim Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8890-2
  • Type

    conf

  • DOI
    10.1109/PSIVT.2010.19
  • Filename
    5673867