Title :
Synthesis for testability: circuits derived from ordered Kronecker functional decision diagrams
Author :
Becker, Bernd ; Drechsler, Rolf
Author_Institution :
Dept. of Comput. Sci., Frankfurt Univ., Germany
Abstract :
Summary form only given. Testability properties of circuits derived from Ordered Kronecker Functional Decision Diagrams (OKFDDs) are studied with respect to the Stuck-At Fault Model (SAFM) and the Cellular Fault Model (CFM). The computation of complete test sets and of all occurring redundancies can be done easily and efficiently and circuits with high testability can be obtained
Keywords :
combinational circuits; design for testability; fault diagnosis; logic design; logic testing; redundancy; cellular fault model; ordered Kronecker functional decision diagrams; redundancies; stuck-at fault model; synthesis for testability; test sets; Carbon capture and storage; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Controllability; Fault location; Inverters; Libraries; Redundancy;
Conference_Titel :
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-7039-8
DOI :
10.1109/EDTC.1995.470336
