Title :
Implications of on-line PD measurement on phase distributions for three-phase belted MV cables
Author :
Wouters, P.A.A.F. ; Van der Wielen, P. C J M
Author_Institution :
Electr. Power Syst. Group, Eindhoven Univ. of Technol., Netherlands
Abstract :
Partial Discharge (PD) activity during on-line cable testing is due to the electric field stress related to the nominal voltages applied on the phase conductors. For a three-phase belted cable the corresponding field in the dielectrics is elliptical. This paper describes the impact of the elliptical nature of the electric field on PD patterns. The excitation of induced charges upon a PD in the phase-conductors and earth screen depend on the direction of the PD, and thereby on the phase angles of the applied voltages. Further, the signal propagation modes together with the signal decoupling at the cable end determine the detected wave-forms and their distribution. The consequences of these aspects are studied for a small spherical void serving as a simple model system. PD distributions are simulated assuming the field in the void completely vanishes by the charge redistribution upon a PD. The induced charges are calculated using Ramo Shockley considerations. The results show that for an elliptical field the patterns obtained from a sensor at one conductor (e.g. earth screen) can differ strongly from the linear field case, e.g. in case of off-line tests with only one phase energized.
Keywords :
cables (electric); conductors (electric); partial discharge measurement; Ramo Shockley considerations; charge redistribution; earth screen; electric field stress; elliptical electric field; off-line tests; on-line PD measurement; on-line cable testing; partial discharge activity; phase conductors; phase distributions; sensor; signal decoupling; signal propagation modes; spherical void; three-phase belted MV cables; Cables; Conductors; Dielectric measurements; Earth; Partial discharge measurement; Partial discharges; Phase measurement; Stress; Testing; Voltage;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
Print_ISBN :
0-7803-7725-7
DOI :
10.1109/ICPADM.2003.1218358