• DocumentCode
    1818298
  • Title

    Built-in current mode circuits for Iddq monitoring

  • Author

    Brown, B.D. ; McLeod, R.D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
  • fYear
    1993
  • fDate
    9-12 May 1993
  • Abstract
    A novel circuit for Iddq monitoring is presented. The circuit is based on current mode signaling and is intended for use in a built-in test mode. A test chip has been fabricated in 1.2 micron CMOS. Preliminary simulation result are very promising and demonstrate that the basic technique may be quite practical
  • Keywords
    built-in self test; 1.2 micron; CMOS; HSPICE; IDDQ test; built-in current mode circuits; built-in test mode; current mode signaling; quiescent current monitoring; Circuit faults; Circuit noise; Circuit testing; Computerized monitoring; Condition monitoring; Current mode circuits; Integrated circuit testing; Production; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0826-3
  • Type

    conf

  • DOI
    10.1109/CICC.1993.590830
  • Filename
    590830
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1818298