DocumentCode :
1818298
Title :
Built-in current mode circuits for Iddq monitoring
Author :
Brown, B.D. ; McLeod, R.D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
fYear :
1993
fDate :
9-12 May 1993
Abstract :
A novel circuit for Iddq monitoring is presented. The circuit is based on current mode signaling and is intended for use in a built-in test mode. A test chip has been fabricated in 1.2 micron CMOS. Preliminary simulation result are very promising and demonstrate that the basic technique may be quite practical
Keywords :
built-in self test; 1.2 micron; CMOS; HSPICE; IDDQ test; built-in current mode circuits; built-in test mode; current mode signaling; quiescent current monitoring; Circuit faults; Circuit noise; Circuit testing; Computerized monitoring; Condition monitoring; Current mode circuits; Integrated circuit testing; Production; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0826-3
Type :
conf
DOI :
10.1109/CICC.1993.590830
Filename :
590830
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1818298
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