Title :
Electrical performance of the front end electronics system for the D0 silicon upgrade
Author :
Angstadt, R. ; Baert, M. ; Bagby, L. ; Johnson, M. ; Matulik, M. ; Utes, M. ; Zimmerman, T. ; Clark, A. ; Collins, T. ; Kerth, R. ; Goozen, F. ; Milgrome, O.
Author_Institution :
Fermi Nat. Accel. Lab., Batavia, IL, USA
Abstract :
The new D0 tracking system uses the radiation-hard SVX-IIe integrated circuit as the ADC for all detectors. We report on the performance of the production version of the chip and some of its associated electronics
Keywords :
analogue-digital conversion; detector circuits; nuclear electronics; silicon radiation detectors; ADC; D0 Si upgrade; SVX-IIe integrated circuit; Si; front end electronics; Application specific integrated circuits; Counting circuits; Data acquisition; Detectors; Dielectric losses; Flexible printed circuits; Laboratories; Pipelines; Silicon; Wire;
Conference_Titel :
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-3534-1
DOI :
10.1109/NSSMIC.1996.590834
