Holographic grating recording for high efficiency in MgF2/Ag/As40Ge10Se15S35 multi-layer films

Dielectric/Metal/Dielectric (D/M/D) multi films can find the electronic and optical application as components of advanced materials design. We investigated the diffraction efficiency of holography using amorphous MgF₂/Ag/As₄₀Ge₁₀Se₁₅S₃₅ multi-layer thin films. Multi-layer structures were formed by alternating a layer of dielectric(MgF₂) metal(Ag) and chalcogenide (As₄₀Ge₁₀Se₁₅S₃₅) in order to be increase the diffraction efficiency. The holographic grating recording in these thin films has been formed using He-Ne laser light (632.8 nm) under the intensity and the phase polarization holography) The diffraction efficiency was obtained by +1st order intensity. As the results, we found the high diffraction efficiency on multi-layer films. The maximum diffraction efficiency of intensity and phase polarization holography was 24% and 15%.