Title :
The noise of MOS magnetic microsensors structures
Author :
Panait, C. ; Caruntu, G.
Abstract :
The paper presents the results of research work regarding the analysis and optimization of magnetic microsensor structures realized in MOS integrated circuits technology. By assimilating the MOSFET channel of almost constant depth with a Hall plate, the results obtained for the conventional Hall plates have been extended to MOS-Hall plates. On the basis of adequate models there have been established the noise main characteristics for bipolar lateral magnetotransistor, where the current deflection effect is dominating. An analysis of the devices characteristics in respect with the channel geometry and the material features has therefore been achieved for the first time.
Keywords :
MOS integrated circuits; MOSFET; bipolar transistors; microsensors; MOS integrated circuits technology; MOS-Hall plates; MOSFET channel; bipolar lateral magnetotransistor; channel geometry; current deflection effect; magnetic microsensor structures; material features; noise main characteristics; Geometry; Integrated circuit noise; Integrated circuit technology; MOS integrated circuits; MOSFET circuits; Magnetic analysis; Magnetic materials; Magnetic noise; Micromagnetics; Paper technology; detection limit; noise-equivalent magnetic induction; signal-to-noise ratio;
Conference_Titel :
Semiconductor Conference, 2008. CAS 2008. International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4244-2004-9
DOI :
10.1109/SMICND.2008.4703370
