• DocumentCode
    1818517
  • Title

    Applying International Patent Classification (IPC) to strategic planning processes of an R&D organization: The case of NECTEC, Thailand

  • Author

    Jotisakulratana, Maleeya ; Koomgun, Naphassanun ; Virojrid, Ratnatee ; Udomsaph, Bhubate

  • Author_Institution
    Nat. Electron. & Comput. Technol. Center (NECTEC), Pathum Thani, Thailand
  • fYear
    2013
  • fDate
    July 28 2013-Aug. 1 2013
  • Firstpage
    1913
  • Lastpage
    1918
  • Abstract
    The International Patent Classification (IPC) is a technology hierarchical classification system used by the World Intellectual Property Organization (WIPO) to classify patents. The fact that IPC covers wide areas of technology (70,000 groups) and is universally used makes its benefits not just limited to a classification of patent but also applicable to other types of R&D output. This paper shares the experience from the National Electronics and Computer Technology Center (NECTEC), an R&D organization of Thailand, in its study to identify the organization´s technological strengths. The organization applied IPC to classify its prototypes and papers, then analyzed and compared the organization´s R&D performance for each IPC. The analysis was conducted using several factors that represent the quality and quantity of prototypes, patents, and papers. Research results suggested which technologies the organization should focus and allocate more resources on, which should be retained, and which should be dropped.
  • Keywords
    patents; research and development; strategic planning; IPC; NECTEC; National Electronics and Computer Technology Center; R&D organization; Thailand; WIPO; World Intellectual Property Organization; international patent classification; strategic planning processes; technology hierarchical classification system; Benchmark testing; Bibliometrics; Laboratories; Organizations; Patents; Prototypes; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Technology Management in the IT-Driven Services (PICMET), 2013 Proceedings of PICMET '13:
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6641621