Title :
On-wafer experimental characterization for a 4-port circuit, using a two-port Vector Network Analyzer
Author :
Simion, S. ; Sajin, G. ; Marcelli, R. ; Bartolucci, G.
Author_Institution :
Nat. Inst. for Res. & Dev. in Microtechnologies, Bucharest
Abstract :
The paper presents an experimental method useful to characterize a four-port circuit, using a two-port VNA (vector network analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.
Keywords :
network analysers; network analysis; 4-port circuit; on-wafer characterization; two-port vector network analyzer; Circuit simulation; Coupling circuits; Electronic mail; Frequency measurement; Impedance; Microwave circuits; Microwave devices; Microwave theory and techniques; Reflection; Scattering; Vector network analyzer; on-wafer measurement; scattering matrices;
Conference_Titel :
Semiconductor Conference, 2008. CAS 2008. International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4244-2004-9
DOI :
10.1109/SMICND.2008.4703375
