• DocumentCode
    1818622
  • Title

    Packaged single pole double thru (SPDT) and true time delay lines (TTDL) based on RF MEMS switches

  • Author

    De Angelis, Giorgio ; Lucibello, Andrea ; Marcelli, Romolo ; Catoni, Simone ; Lanciano, Antonio ; Buttiglione, Roberta ; Dispenza, Massimiliano ; Giacomozzi, Flavio ; Margesin, Benno ; Maglione, Alfredo ; Erspan, Mirko ; Combi, Chantal

  • Author_Institution
    CNR-IMM Roma, Rome
  • Volume
    1
  • fYear
    2008
  • fDate
    13-15 Oct. 2008
  • Firstpage
    227
  • Lastpage
    230
  • Abstract
    Packaged MEMS devices for RF applications have been modelled, realized and tested. In particular, RF MEMS single ohmic series switches (SPST) have been obtained on silicon high resistivity substrates and they have been integrated in alumina packages to get single-pole-double-thru (SPDT) and true-time-delay-line (TTDL) configurations. As a result, TTDLs for wide band operation, designed for the (6-18) GHz band, have been obtained, with predicted insertion losses less than 2 dB up to 14 GHz for the short path and 3 dB for the long path, and delay times in the order of 0.3-0.4 ns for the short path and 0.5-0.6 ns for the long path. The maximum differential delay time is in the order of 0.2 ns.
  • Keywords
    delays; electronics packaging; microswitches; microwave switches; RF MEMS single ohmic series switches; alumina packages; frequency 6 GHz to 18 GHz; insertion losses; packaged single pole double thru; silicon high resistivity substrates; time 0.2 ns; time 0.3 ns to 0.4 ns; time 0.5 ns to 0.6 ns; true time delay lines; Conductivity; Delay effects; Microelectromechanical devices; Packaging; Radio frequency; Radiofrequency microelectromechanical systems; Silicon; Switches; Testing; Wideband; RF MEMS; SPDT; SPST; TTDL; packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2008. CAS 2008. International
  • Conference_Location
    Sinaia
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-4244-2004-9
  • Type

    conf

  • DOI
    10.1109/SMICND.2008.4703376
  • Filename
    4703376