DocumentCode :
1818657
Title :
A new approach for early dependability evaluation based on formal property checking and controlled mutations
Author :
Leveugle, R.
Author_Institution :
TIMA Lab., Grenoble, France
fYear :
2005
fDate :
6-8 July 2005
Firstpage :
260
Lastpage :
265
Abstract :
The interest for early analyses of the functional impact of faults in a circuit is growing, due to the increasing probability of transient faults. However, experiments are often very long, especially when spatial and temporal multiplicity has to be taken into account in the fault model. Formal property checking is an appealing approach to perform comprehensive functional validations but is intended to validate properties only in nominal operation, not after a fault has occurred. This paper proposes a new approach combining formal property checking and the generation of specific circuit mutants to achieve efficient early identification of unacceptable effects of multiple faults.
Keywords :
fault simulation; formal verification; network analysis; performance evaluation; transient analysis; controlled mutations; early dependability evaluation; fault impact; formal property checking; spatial multiplicity; temporal multiplicity; transient faults; Analytical models; CMOS technology; Circuit faults; Circuit simulation; Emulation; Genetic mutations; Instruments; Robustness; Single event upset; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
Type :
conf
DOI :
10.1109/IOLTS.2005.8
Filename :
1498171
Link To Document :
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