DocumentCode :
1818686
Title :
CAS 2008 organized by National Institute for Research and Development in Microtechnologies (IMT-Bucharest) [Copyright notice]
Volume :
2
fYear :
2008
fDate :
13-15 Oct. 2008
Abstract :
Copyright and Reprint Permission: Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limit of US copyright law for private use of patrons those articles in this volume that carry a code at the bottom of the first page, provided the per-copy fee indicated in the code is paid through Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923. For other copying, reprint or republication permission, write to IEEE Copyrights Manager, IEEE Operatons Center, 445 Hoes Lane, P.O.Box 1331, Piscataway, NJ 08855-1331. All rights reserved. Copyright (c) 2007 by the Institute of Electrical and Electronics Engineers.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2008. CAS 2008. International
Conference_Location :
Sinaia
ISSN :
1545-827X
Print_ISBN :
978-1-4244-2004-9
Type :
conf
DOI :
10.1109/SMICND.2008.4703381
Filename :
4703381
Link To Document :
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