Yield Prediction of High Performance Pipelined Circuit with Respect to Delay Failures in Sub-100nm Technology

In nanoscale technology, large variations in process parameters produce wide delay spread in high performance circuit. In this paper the authors developed analytical models for yield prediction with respect to delay variation of pipeline design. The converse problem of estimating the design space for individual pipe stages based on a target yield has been addressed. For an example 4 stage pipelined circuit proposed analytical models are verified to predict yield within 2% of results obtained from Monte-Carlo Hspice simulation