DocumentCode
1818711
Title
Integrated constant-fraction discriminator shaping techniques for the PHENIX lead-scintillator calorimeter
Author
Jackson, R. Gentry ; Blalock, T. Vaughn ; Simpson, Michael L. ; Wintenberg, A.L. ; Young, Glenn R.
Author_Institution
Tennessee Univ., Knoxville, TN, USA
Volume
1
fYear
1996
fDate
2-9 Nov 1996
Firstpage
51
Abstract
The suitability of several on-chip constant-fraction discriminator (CFD) shaping methods for use in the multichannel PHENIX Lead-Scintillator detector has been investigated. Three CFD circuits utilizing a distributed R-C delay-line, a lumped-element R-C delay-line and the Nowlin shaping method have been realized in a standard 1.2-μm n-well CMOS process. A CFD using ideal delay-line shaping was also studied for comparison. Time walk for 5 ns risetime input signals over a dynamic range of -2 V to -20 mV was less than ±175 ps, ±150 ps, ±150, and ±185 ps while worst case rms timing jitter measured 85 ps, 90 ps, 100 ps, and 65 ps, respectively, for the four methods mentioned above. Area requirements for the three candidate methods tested including the fraction circuit were 172 μ×70 μ, 160 μ×65 μ, 179 μ× 53 μ, respectively. The fraction circuit area for the external delay-line circuit was 67 μ×65 μ. Each shaping method studied consumed no power from the dc supply
Keywords
CMOS integrated circuits; delay lines; detector circuits; digital-analogue conversion; discriminators; jitter; mixed analogue-digital integrated circuits; nuclear electronics; pulse shaping circuits; solid scintillation detectors; CMOS process; Nowlin shaping method; PHENIX lead-scintillator calorimeter; delay-line shaping; distributed R-C delay-line; integrated constant-fraction discriminator shaping techniques; lumped-element R-C delay-line; multichannel PHENIX Lead-Scintillator detector; on-chip constant-fraction discriminator shaping methods; timing jitter; Circuit testing; Computational fluid dynamics; Delay; Detectors; Dynamic range; Integrated circuit measurements; Laboratories; Noise shaping; Time measurement; Timing jitter;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
0-7803-3534-1
Type
conf
DOI
10.1109/NSSMIC.1996.590890
Filename
590890
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