Title :
Mitigating soft errors to prevent a hard threat to dependable computing
Author :
Crouzet, Yves ; Collet, Jacques ; Arlat, Jean
Author_Institution :
LAAS-CNRS, Toulouse, France
Abstract :
This paper presents first the context and motivation for dealing with soft errors. In order to be able to account for the various issues involved, a concerted reflection has been carried out including embedded system integrators, manufacturers, and academic researchers. The authors have summarized the main outcomes of this effort. Finally, the various contributions that are meant to address the several factors that characterize the problem posed by soft errors and provide solutions was introduced to mitigate their effects.
Keywords :
embedded systems; error analysis; error statistics; fault tolerant computing; radiation effects; concerted reflection; dependable computing; embedded system; soft errors; Aerospace electronics; Alpha particles; Computer errors; Electronic equipment testing; Embedded system; Manufacturing; Radiation effects; Reflection; Resilience; Single event upset;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.42