Title :
Overview of soft errors issues in aerospace systems
Author :
Boléat, Christian ; Colas, Gérard
Author_Institution :
Astrium EADS, Toulouse, France
Abstract :
Semiconductor manufacturing has been a major contributor to the industrial developments in the past decades. Nevertheless, the introduction, in the last decade, of new microprocessor architectures has limited this contribution in the space/avionics domain. One reason for the absence of the most recent and powerful processors in these embedded systems is mainly due to the severe constraints found in these harsh environments: the high risk of errors and failures induced by radiations. Indeed, for processor manufacturers accounting for such specific constraints would not pay of with respect to the main market of ground-level embedded systems.
Keywords :
avionics; embedded systems; radiation effects; semiconductor device manufacture; semiconductor device testing; aerospace systems; embedded systems; harsh environments; microprocessor architectures; semiconductor manufacturing; soft errors; Aerospace electronics; Atmosphere; Atomic layer deposition; Degradation; Embedded system; IEC standards; Ionization; Neutrons; Radiation effects; Silicon;
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.55