• DocumentCode
    1818872
  • Title

    Electroluminescence yield for λ>165 nm in neon-xenon mixtures: experimental results

  • Author

    Borges, F.I.G.M. ; Dos Santos, J.M.F. ; Kubota, S. ; Conde, C.A.N.

  • Author_Institution
    Dept. of Phys., Coimbra Univ., Portugal
  • Volume
    1
  • fYear
    1996
  • fDate
    2-9 Nov 1996
  • Firstpage
    77
  • Abstract
    The electroluminescence yield for λ>165 nm in different neon-xenon mixtures is studied as a function of the reduced electric field. These studies were performed using a uniform-field gas proportional scintillation counter. The experimental values obtained for the scintillation and ionization thresholds decrease from approximately 1 and 6 Vcm-1 torr-1 for 100% xenon, to about 0.5 and 3.8 Vcm-1 torr-1 for 20% xenon, to 0.4 and 2.8 Vcm-1 torr-1 for 10% xenon and to 0.3 and 2.2 Vcm -1 torr-1 for 5% xenon. Detector energy resolutions for the Al K line (1.5 keV) are 15% for 20% xenon, 19% for 10% xenon and 22% for 5% xenon
  • Keywords
    X-ray detection; electroluminescence; gas mixtures; gas scintillation detectors; neon; photoionisation; proportional counters; scintillation; xenon; 165 nm; Al K line; Ne-Xe; Ne-Xe mixtures; detector energy resolutions; electroluminescence yield; ionization threshold; reduced electric field; scintillation threshold; uniform-field gas proportional scintillation counter; Atomic measurements; Bellows; Electroluminescence; Electrons; Energy resolution; Gases; Ionization; Photomultipliers; Solid scintillation detectors; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.590896
  • Filename
    590896