DocumentCode :
1818946
Title :
Fast marching method to correct for refraction in ultrasound computed tomography
Author :
Li, Shengying ; Mueller, Klaus ; Jackowski, Marcel ; Dione, Donald P. ; Staib, Lawrence H.
Author_Institution :
Dept. of Comput. Sci., Stony Brook Univ., NY
fYear :
2006
fDate :
6-9 April 2006
Firstpage :
896
Lastpage :
899
Abstract :
A significant obstacle in the advancement of ultrasound computed tomography has been the lack of efficient and precise methods for the tracing of the bent rays that result from the interaction of sound with refractive media. In this paper, we propose the use of the fast marching method (FMM) to solve the eikonal equation which governs the propagation of sound waves. The FMM enables us to determine with great accuracy and ease the distorted paths that the sound rays take from an emitter to the receivers. We show that knowledge of the accurate path proves crucial for an object reconstruction at high fidelity and accurate geometry. We employ a two-phase approach with an iterative method, SART, to faithfully reconstruct two tissue properties relevant in clinical diagnosis, such as mammography: speed of sound and sound attenuation. We demonstrate our results by ways of a newly designed analytical ultrasound breast phantom
Keywords :
bioacoustics; biological organs; biomedical ultrasonics; computerised tomography; image reconstruction; iterative methods; mammography; medical image processing; phantoms; ultrasonic propagation; SART; clinical diagnosis; eikonal equation; fast marching method; iterative method; mammography; object reconstruction; refraction correct; sound attenuation; sound speed; sound wave propagation; tissue properties; two-phase approach; ultrasound breast phantom; ultrasound computed tomography; Acoustic propagation; Acoustic refraction; Attenuation; Clinical diagnosis; Computed tomography; Equations; Geometry; Iterative methods; Mammography; Ultrasonic imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: Nano to Macro, 2006. 3rd IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7803-9576-X
Type :
conf
DOI :
10.1109/ISBI.2006.1625063
Filename :
1625063
Link To Document :
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