Title :
2005 IEEE International Workshop on Memory Technology, Design and Testing
Abstract :
The following topics are dealt with: nonvolatile memories; new memory devices; design and test of DRAMs; built-in self test; memory test and repair; SRAM design and characterization.
Keywords :
CMOS logic circuits; CMOS memory circuits; DRAM chips; built-in self test; embedded systems; integrated circuit testing; read-only storage; DRAM; SRAM; built in self test; dynamic random access memory; embedded memories; memory devices; nonvolatile memories;
Conference_Titel :
Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on
Conference_Location :
Taipei
Print_ISBN :
0-7695-2313-7
DOI :
10.1109/MTDT.2005.4
