Title :
Coherent phonon spectroscopy using time-resolved x-ray diffraction
Author :
Lindenberg, A.M. ; Kang, I. ; Johnson, S.L. ; Falcone, R.W. ; Heimann, P.A. ; Missalla, T. ; Chang, Z. ; Lee, R.W. ; Wark, J.S.
Author_Institution :
Dept. of Phys., California Univ., Berkeley, CA, USA
Abstract :
Summary form only given. Time-resolved x-ray diffraction enables one to directly measure the dynamics of solids on atomic length scales in real-time. In this experiment, x-ray diffraction with 2 ps resolution is used to observe coherent acoustic vibrations at frequencies approaching 0.1 THz. The acoustic phonon dispersion relation in InSb near the Brillouin zone center is measured. Microscopic electron-phonon coupling-times are extracted. On time-scales shorter than the dephasing of the coherent oscillations, two-pulse excitation is used to coherently control the amplitude of the vibrational excitations. X-rays from the Advanced Light Source synchrotron are monochromatized to a wavelength of 5 keV and then diffracted off an InSb wafer onto a streak camera detector.
Keywords :
III-V semiconductors; X-ray diffraction; X-ray monochromators; dispersion relations; high-speed optical techniques; indium compounds; streak photography; synchrotron radiation; 0.1 THz; Advanced Light Source synchrotron; Brillouin zone center; InSb; acoustic phonon dispersion relation; atomic length scales; coherent acoustic vibrations; coherent oscillations; coherent phonon spectroscopy; coherently control; microscopic electron-phonon coupling-times; ps resolution; real-time; solids; streak camera detector; time resolved x-ray diffraction; time-scales; two-pulse excitation; vibrational excitations; Acoustic diffraction; Acoustic measurements; Atomic measurements; Dispersion; Frequency; Length measurement; Phonons; Solids; Spectroscopy; X-ray diffraction;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2001. QELS '01. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-663-X
DOI :
10.1109/QELS.2001.961931