• DocumentCode
    1819197
  • Title

    Embedded OTP fuse in CMOS logic process

  • Author

    Lin, Ching-Yuan ; Lin, Chung-Hung ; Ho, Chien-Hung ; Liao, Wei-Wu ; Lee, Shu-Yueh ; Ho, Ming-Chou ; Wang, Shih-Chen ; Huang, Shih-Chan ; Lin, Yuan-Tai ; Hsu, Charles Ching-Hsiang

  • Author_Institution
    eMemory Technol. Incorporation, Hsinchu, Taiwan
  • fYear
    2005
  • fDate
    5-5 Aug. 2005
  • Firstpage
    13
  • Lastpage
    15
  • Abstract
    This paper presents the embedded OTP fuse in standard CMOS logic compatible process without additional mask. The embedded OTP fuse can be programmed in 100μs per byte and be accessed in 6ns for 32 bits at once. The 32-bit OTP fuse takes less than 0.0085mm 2 in 0.25μm CMOS process and has 10-year data retention at 85°C.
  • Keywords
    CMOS logic circuits; embedded systems; random-access storage; 0.25 micron; 10 yrs; 100 mus; 6 ns; 85 C; CMOS logic process; data retention; embedded OTP fuse; CMOS logic circuits; CMOS process; Costs; Electrons; Fuses; Latches; MOS devices; MOSFETs; Nonvolatile memory; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on
  • Conference_Location
    Taipei
  • ISSN
    1087-4852
  • Print_ISBN
    0-7695-2313-7
  • Type

    conf

  • DOI
    10.1109/MTDT.2005.22
  • Filename
    1498196
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1819197