Title :
Via-programmable read-only memory design for full code coverage using a dynamic bit-line shielding technique
Author :
Chang, Meng-Fan ; Wen, Kuei-Ann ; Kwai, Ding-Ming
Author_Institution :
Inst. of Electron., National Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
Crosstalk between bit lines leads to read-1 failure in a high-speed via-programmable read only memory (ROM) and limits the coverage of applicable code patterns. Due to the fluctuations in bit-line intrinsic and coupling capacitances, the amount of noise coupled to a selected bit line may vary, resulting in the reduction of sensing margin. In this paper, we propose a dynamic bit-line shielding (DBS) technique, suitable to be implemented in compliable ROM, to eliminate the crosstalk-induced read failure and to achieve full code coverage. Experiments of the 256Kb instances with and without the DBS circuit were undertaken using 0.25μm and 0.18μm standard CMOS processes. The test results demonstrate the read-1 failures and confirm that the DBS technique can remove them successfully, allowing the ROM to operate under a wide range of supply voltage.
Keywords :
CMOS memory circuits; memory architecture; read-only storage; 0.18 micron; 0.25 micron; 256 kbit; CMOS process; DBS circuit; coupling capacitances; crosstalk-induced read failure; dynamic bit-line shielding; full code coverage; read-1 failure; sensing margin reduction; via programmable read-only memory design; CMOS process; Capacitance; Crosstalk; Intellectual property; Libraries; Logic testing; Read only memory; Satellite broadcasting; Synchronous generators; Voltage;
Conference_Titel :
Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on
Conference_Location :
Taipei
Print_ISBN :
0-7695-2313-7
DOI :
10.1109/MTDT.2005.36