DocumentCode :
1819485
Title :
Logic for static hazard detection of multiple-valued logic circuits with TSUM, MIN, and Literals
Author :
Tkagi, Noboru ; Nakashima, Kyoichi
Author_Institution :
Dept. of Electron. & Informatics, Toyama Prefectural Univ., Japan
fYear :
2002
fDate :
2002
Firstpage :
46
Lastpage :
51
Abstract :
Multiple-valued logic circuits are often implemented by the current mode CMOS technology, or sometimes the voltage mode technology. Even if multiple-valued logic circuits are realized by either one of the two technologies, the signal propagation delay will cause hazards pluses, which are undesirable short pulses in circuits. This paper will focus on static hazards in multiple-valued logic circuits. The paper is supposed to have a device technology such as the current mode CMOS technology, because the way of information signals transition is very important to introduce a logical model for hazards detection of multiple-valued logic circuits. We will show some of the mathematical properties of functions on the logical model introduced by the paper. Multiple-valued logic circuits are supposed to be constructed by the truncated sum, the minimum, and the literal gates
Keywords :
CMOS logic circuits; integrated logic circuits; logic testing; multivalued logic; current mode CMOS technology; hazards detection; literal gates; multiple-valued logic circuits; signal propagation delay; static hazard detection; truncated sum; voltage mode technology; CMOS logic circuits; CMOS technology; Hazards; Logic circuits; Mathematical model; Paper technology; Propagation delay; Pulse circuits; Semiconductor device modeling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multiple-Valued Logic, 2002. ISMVL 2002. Proceedings 32nd IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
0-7695-1462-6
Type :
conf
DOI :
10.1109/ISMVL.2002.1011069
Filename :
1011069
Link To Document :
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