• DocumentCode
    1819621
  • Title

    Spatio-temporal cell segmentation and tracking for automated screening

  • Author

    Padfield, Dirk ; Rittscher, Jens ; Roysam, Badrinath

  • Author_Institution
    GE Global Res., Niskayuna, NY
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    376
  • Lastpage
    379
  • Abstract
    A growing number of screening applications require the automated monitoring of cell populations including cell segmentation, tracking, and measurement. We present general methods for cell segmentation and tracking that exploit the spatio- temporal nature of the task to constrain segmentation. The images are de-noised and segmented by combining wavelet coefficients at various levels, thus enabling extraction of cells in images with low contrast-to-noise ratios. Each track of clustered cells resulting from association of nearby cells in the spatio-temporal volume is then split into individual cells by evolving sets of contours from other slices. The hypothesis whether to split or merge objects making up the cluster is tested using learned features trained from single track cells. Due to the difficult nature of generating ground truth, we also present a framework for edit-based validation whereby the user corrects the edits made by the automatic system rather than generating the truth from scratch. The results show the promise of the approach and demonstrate the ability of the algorithms to provide meaningful measurements of cell response to drug treatment in low-dose Hoechst-stained cells.
  • Keywords
    biological techniques; cellular biophysics; image segmentation; Hoechst-stained cells; spatio-temporal cell segmentation; wavelet coefficients; Biomedical measurements; Cells (biology); DNA; Data mining; Fluorescence; Image segmentation; Monitoring; Surveillance; Target tracking; Wavelet coefficients; Spatio-temporal analysis; cell segmentation; cell tracking; edit-based validation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-2002-5
  • Electronic_ISBN
    978-1-4244-2003-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2008.4541011
  • Filename
    4541011