• DocumentCode
    1819798
  • Title

    Blind estimation of fMRI data for improved BOLD contrast detection

  • Author

    Atkinson, Ian ; Kamalabadi, Farzad ; Jones, Douglas L. ; Thulborn, Keith R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL
  • fYear
    2006
  • fDate
    6-9 April 2006
  • Firstpage
    1056
  • Lastpage
    1059
  • Abstract
    Variations due to noise about the baseline MR signal make detection of BOLD contrast in fMRI data difficult for voxels with weak activation. We present a new wavelet- and Fourier-based estimation technique that improves the ability of a t-test to detect BOLD contrast in fMRI data. Our scheme approximates the optimal linear estimator for an fMRI dataset using a 3-D discrete wavelet transform to decorrelate in space and the discrete Fourier transform to decorrelate in time. In contrast to the optimal estimator, which is useful only in theory as it requires second-order signal and noise statistics, the proposed technique is able to achieve blind estimation of fMRI data. Applying this estimator to fMRI data improves the ability to correctly detect BOLD contrast, especially for voxels with contrast levels between 1% and 2%. In addition, the proposed method produces increased confidence (lower p-value) in active voxels of both synthetic and experimental fMRI data (compared to an unestimated version of the same voxels)
  • Keywords
    biomedical MRI; blood; decorrelation; discrete Fourier transforms; estimation theory; medical image processing; statistical analysis; wavelet transforms; 3-D discrete wavelet transform; BOLD contrast detection; blind estimation; decorrelation; discrete Fourier transform; fMRI; noise; optimal linear estimator; t-test; Data engineering; Decorrelation; Discrete Fourier transforms; Discrete wavelet transforms; Error correction; Magnetic resonance; Noise reduction; Signal detection; Statistical analysis; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: Nano to Macro, 2006. 3rd IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7803-9576-X
  • Type

    conf

  • DOI
    10.1109/ISBI.2006.1625103
  • Filename
    1625103