PODEM based on static testability measures and dynamic testability measures for multiple-valued logic circuits

In this paper, PODEM for multiple-valued logic circuits is proposed. It consists of the D-propagation, implication and backtracing operation. To guide the D-propagation (or backtracing operation), observability (or controllability) measures are introduced. They are computed by simple recursive formulas, and enable us to reduce the frequency of backtracking. In addition, the scheme of exploiting static testability measures up to a certain stage of test generation and then resorting to dynamic testability measures is incorporated into PODEM. The experimental results on ternary benchmark circuits show that the above scheme is useful in generating as many test patterns as possible whilst shortening the total time required for the test generation