Title :
Correlation between IDDQ testing quality and sensor accuracy
Author :
Dalpasso, Marcello ; Favalli, Michele ; Olivo, Piero
Author_Institution :
Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
Abstract :
In existing approaches to IDDQ fault simulation, the lack of estimate of the faulty current values in comparison with the instrumentation sensitivity prevents realistic assessments of testing quality. This paper fills the gap, presenting a method to estimate the faulty current considering the device conductances as well as the bridging resistance, and computing the fault coverage as a function of the sensor accuracy. Such information helps in the design of current monitoring equipments
Keywords :
CMOS integrated circuits; circuit analysis computing; fault diagnosis; fault location; integrated circuit testing; CMOS; IDDQ testing quality; bridging resistance; current monitoring equipment; device conductances; fault coverage; fault simulation; faulty current values; sensor accuracy; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Current measurement; Electrical fault detection; Fault detection; Instruments; Integrated circuit testing; Monitoring;
Conference_Titel :
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-7039-8
DOI :
10.1109/EDTC.1995.470343
