DocumentCode :
1820091
Title :
A 0.5-18 GHz Semi-Automatic Noise Parameter Measurement Technique
Volume :
1
fYear :
1982
fDate :
30103
Firstpage :
42
Lastpage :
58
Keywords :
Acoustic reflection; Admittance measurement; Equations; Measurement techniques; Noise figure; Noise measurement; Noise reduction; Parameter estimation; Scattering parameters; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 19th ARFTG
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1982.323482
Filename :
4118870
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1820091
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