DocumentCode :
1820277
Title :
The measured electron response nonproportionality of CaF2, BGO, LSO, and GSO
Author :
Taulbee, T.D. ; Rooney, B.D. ; Mengesha, W. ; Valentine, J.D.
Author_Institution :
Dept. of Mech., Ind., & Nucl. Eng., Cincinnati Univ., OH, USA
Volume :
1
fYear :
1996
fDate :
2-9 Nov 1996
Firstpage :
326
Abstract :
To study the light yield nonproportionality and intrinsic energy resolution of inorganic scintillators, a Compton coincidence technique was previously designed, implemented and benchmarked. This technique provides the ability to accurately measure the electron response of scintillation materials and thus provides an accurate means of studying light yield nonproportionality. In this study, the electron responses of two “classic” scintillators (CaF2(Eu) and Bi4Ge3O12 (BGO)) and two newer scintillators (Lu2SiO5:Ce3+ (LSO) and Gd2SiO5:Ce3+ (GSO)) have been measured over the energy range of about 5 keV to approximately 450 keV using this technique. Electron responses for all four scintillators are observed to increase monotonically with electron energy. BGO is observed to have the least nonproportionality, with its electron response varying about 20% over this energy range. Conversely the LSO electron response is observed to vary about 50% over this energy range and thus exhibits the largest nonproportionality
Keywords :
bismuth compounds; calcium compounds; electron detection; gadolinium compounds; lutetium compounds; scintillation; solid scintillation detectors; 5 to 450 keV; BGO; Bi4Ge3O12; CaF2; CaF2(Eu); CaF2:Eu; Compton coincidence technique; GSO; Gd2SiO5:Ce; Gd2SiO5:Ce3+; LSO; Lu2SiO5:Ce; Lu2SiO5:Ce3+; electron response nonproportionality; inorganic scintillators; intrinsic energy resolution; light yield nonproportionality; Calibration; Design engineering; Electrons; Energy measurement; Energy resolution; Gamma rays; Light scattering; Particle scattering; Power engineering and energy; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
0-7803-3534-1
Type :
conf
DOI :
10.1109/NSSMIC.1996.590969
Filename :
590969
Link To Document :
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