DocumentCode
1820277
Title
The measured electron response nonproportionality of CaF2, BGO, LSO, and GSO
Author
Taulbee, T.D. ; Rooney, B.D. ; Mengesha, W. ; Valentine, J.D.
Author_Institution
Dept. of Mech., Ind., & Nucl. Eng., Cincinnati Univ., OH, USA
Volume
1
fYear
1996
fDate
2-9 Nov 1996
Firstpage
326
Abstract
To study the light yield nonproportionality and intrinsic energy resolution of inorganic scintillators, a Compton coincidence technique was previously designed, implemented and benchmarked. This technique provides the ability to accurately measure the electron response of scintillation materials and thus provides an accurate means of studying light yield nonproportionality. In this study, the electron responses of two “classic” scintillators (CaF2(Eu) and Bi4Ge3O12 (BGO)) and two newer scintillators (Lu2SiO5:Ce3+ (LSO) and Gd2SiO5:Ce3+ (GSO)) have been measured over the energy range of about 5 keV to approximately 450 keV using this technique. Electron responses for all four scintillators are observed to increase monotonically with electron energy. BGO is observed to have the least nonproportionality, with its electron response varying about 20% over this energy range. Conversely the LSO electron response is observed to vary about 50% over this energy range and thus exhibits the largest nonproportionality
Keywords
bismuth compounds; calcium compounds; electron detection; gadolinium compounds; lutetium compounds; scintillation; solid scintillation detectors; 5 to 450 keV; BGO; Bi4Ge3O12; CaF2; CaF2(Eu); CaF2:Eu; Compton coincidence technique; GSO; Gd2SiO5:Ce; Gd2SiO5:Ce3+; LSO; Lu2SiO5:Ce; Lu2SiO5:Ce3+; electron response nonproportionality; inorganic scintillators; intrinsic energy resolution; light yield nonproportionality; Calibration; Design engineering; Electrons; Energy measurement; Energy resolution; Gamma rays; Light scattering; Particle scattering; Power engineering and energy; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
0-7803-3534-1
Type
conf
DOI
10.1109/NSSMIC.1996.590969
Filename
590969
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