• DocumentCode
    1820435
  • Title

    Innovations in test automation

  • Author

    Sproch, Jim ; Howells, Michael ; Rajski, Janusz

  • Author_Institution
    Synopsys Inc.
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    43
  • Lastpage
    43
  • Keywords
    Automatic testing; Design automation; Electronic equipment testing; Electronics industry; Graphics; Manufacturing automation; National electric code; Semiconductor device testing; System testing; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
  • Print_ISBN
    0-7695-1570-3
  • Type

    conf

  • DOI
    10.1109/VTS.2002.1011109
  • Filename
    1011109
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1820435