DocumentCode :
1820512
Title :
Combining multiple 2ν-SVM classifiers for tissue segmentation
Author :
Artan, Yusuf ; Huang, Xiaolei
Author_Institution :
Dept. of Electr. Eng., Lehigh Univ., Bethlehem, PA
fYear :
2008
fDate :
14-17 May 2008
Firstpage :
488
Lastpage :
491
Abstract :
In image classification problems, especially those involving tumor or precancerous lesion, we are usually faced with the situation in which the cost of mistakenly classifying samples in one class is much higher than that of the opposite mistake in the other class. Therefore it is essential to include cost information about classes in our classification methods. This paper applies a cost-sensitive 2v-SVM classification scheme to cervical cancer images to separate diseased regions from healthy tissue. Using this method, we are able to specify a higher weight to the class that is deemed more important. To the best of our knowledge, cost-sensitive SVM based medical image classification has not been done before. We specifically target segmenting disease regions in digitized uterine cervix images in a NCI/NLM archive of 60,000 images. Our second contribution is the introduction of a multiple classifier scheme instead of the traditional single classifier model. Using the multiple classifier scheme improves significantly classification accuracy as demonstrated by our experiments.
Keywords :
biological tissues; diseases; image classification; image segmentation; medical image processing; disease; medical image classification; multiple 2v-SVM classifiers; tissue segmentation; uterine cervix images; Biomedical imaging; Cervical cancer; Costs; Diseases; Image classification; Image segmentation; Lesions; Neoplasms; Support vector machine classification; Support vector machines; Image classification; classification cost; costsensitive classifiers; multiple classifier system; segmentation evaluation; support vector machines; tissue segmentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
Type :
conf
DOI :
10.1109/ISBI.2008.4541039
Filename :
4541039
Link To Document :
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