DocumentCode
1820532
Title
On software development to support statistical simulation of analogue circuits
Author
Driouk, Evgueni ; Jarov, Oleg ; Sukhodolsky, Alexander
Author_Institution
Dept. of Microelectron., Byelorussian State Univ. of Inf. & Radioelectron., Minsk, Byelorussia
fYear
1995
fDate
6-9 Mar 1995
Firstpage
539
Lastpage
543
Abstract
A system for statistical circuit analysis, yield estimation and design centering is presented. The system architecture is based on the decomposition of the simulation process into three logically independent layers. A dedicated language is a significant part of the system. Its syntax implements an advanced technique that allows one to create flexible circuit performance extraction procedures. An application example demonstrates the system capabilities
Keywords
analogue integrated circuits; circuit analysis computing; integrated circuit yield; software engineering; statistical analysis; analogue circuits; circuit performance extraction procedures; dedicated language; design centering; software development; statistical circuit analysis; statistical simulation; yield estimation; Analytical models; Circuit optimization; Circuit simulation; Circuit synthesis; Data mining; Manufacturing; Production; Programming; Statistical analysis; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location
Paris
Print_ISBN
0-8186-7039-8
Type
conf
DOI
10.1109/EDTC.1995.470348
Filename
470348
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